Variety traits

Plant height — Leek

Allium porrum L.

An important morphometric indicator for leeks, characterizing the total length from the soil to the leaf tips and the height of the pseudostem, which determines the marketability and agronomic requirements of the variety.

In the reference 37 varieties crop Leek, where this is mentioned in the description.

For leeks, plant height is measured as the distance from the soil surface to the tips of the longest leaves. Another important differentiating trait is the pseudostem height, measured from the base to the point where the first free leaves emerge, as it is this that determines the consumer value of the product.

Height values vary depending on the variety: from 70–80 cm in relatively short varieties, such as 'Columbus', to 110–150 cm in vigorous varieties, such as 'Karantansky' and 'Vesta'. Height classification within variety trials is conducted according to UPOV protocols, with grades ranging from very short to very tall.

This trait has a direct impact on cultivation technology: tall-growing varieties require a larger growing area, and the potential for forming the blanched part of the pseudostem depends directly on the total plant height and the intensity of hilling. Breeding for height also takes into account the risk of plant lodging.

General information about the subject — on the page Plant height.

Sources8

Varieties of Leek mentioned in the description

Selection based on the description text, not on official evaluation: these data are absent from registers. For specific variety details, please refer to its profile.